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Proceedings Paper

Vibration characteristics of aluminum material and its influences on laser Doppler voice acquisition
Author(s): Yu-ze Zhang; Li-yan Li; You-wan Tong; Hua-lin Zeng; Yan Zhou
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Paper Abstract

Laser Doppler technology is widely used in precision vibration measurement such as voice acquisition. The fundamental of voice acquisition is to detect the vibration of targets induced by sound wave using a Laser Doppler voice acquisition system, and then demodulate the voice signal from interference signal. Therefore the target’s vibration characteristics will be the principal factor influencing the effect of voice acquisition. In this paper, we focus on the plane structure’s vibration characteristics caused by voice. There are mainly two parts in this paper, simulation and experimental verify. In simulation, the finite element method is used. The Finite Element Analysis method is widely used in material properties analysis, dynamic analysis, and acoustic analysis. Through finite element analysis method, the plane structure models of thick smooth aluminum are established by ANSYS. Then the frequency responses of different constraints are compared. The Laser Doppler voice acquisition system is applied to test and verify the simulation results. The response characteristics of aluminum board under different excitation frequency are measured. The experimental results and simulation results are compared to verify the correctness and reasonableness of simulation. At the same time, this provides theoretical guidance for Laser Doppler voice acquisition system to choose targets and improve voice acquisition performance.

Paper Details

Date Published: 11 September 2013
PDF: 7 pages
Proc. SPIE 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications, 89074B (11 September 2013); doi: 10.1117/12.2034718
Show Author Affiliations
Yu-ze Zhang, Institute of Semiconductors (China)
Li-yan Li, Institute of Semiconductors (China)
You-wan Tong, Institute of Semiconductors (China)
Hua-lin Zeng, Institute of Semiconductors (China)
Yan Zhou, Institute of Semiconductors (China)

Published in SPIE Proceedings Vol. 8907:
International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
Haimei Gong; Zelin Shi; Qian Chen; Jin Lu, Editor(s)

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