
Proceedings Paper
The characteristic performance of an extreme ultraviolet MCP-based photon-counting imaging detectorFormat | Member Price | Non-Member Price |
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Paper Abstract
A new prototype of two-dimensional photon-counting imaging detector with a bare microchannel plate (MCP) stack and
induced charge wedge-strip anode in extreme ultraviolet (EUV) region has been developed, which will be applied to a
moon-based EUV camera. The detector mainly is composed of a MCP stack operating in pulse-counting mode, induced
charge wedge-strip anode (WSA) and correlative analog and data processing circuit. A three electrode wedge-strip
position-sensitive anode with 1.5 mm period and 48 mm diameter active area was fabricated by picosecond laser
processing technology, and front-end analog and data circuit with maximum rate 300kHz also been developed. Operating
characteristics of the prototype of MCP detector including background rate, pulse height distribution, gain, image
linearity and spatial resolution were measured. The measured results show that the spatial resolution can arrive at
5linepair/mm, this responds to 0.2 mm, background rate is less than 1counts/cm2•s. These specifications can completely satisfy the requirement of moon-based EUV camera on the spatial resolution and background rate.
Paper Details
Date Published: 21 August 2013
PDF: 6 pages
Proc. SPIE 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications, 89081Q (21 August 2013); doi: 10.1117/12.2034459
Published in SPIE Proceedings Vol. 8908:
International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications
Jun Ohta; Nanjian Wu; Binqiao Li, Editor(s)
PDF: 6 pages
Proc. SPIE 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications, 89081Q (21 August 2013); doi: 10.1117/12.2034459
Show Author Affiliations
Qiliang Ni, Changchun Institute of Optics, Fine mechanics and Physics (China)
Kefei Song, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Published in SPIE Proceedings Vol. 8908:
International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications
Jun Ohta; Nanjian Wu; Binqiao Li, Editor(s)
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