Paper Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 8819, including the Title Page, Copyright Information, Table of Contents, and the Conference Committee listing.
Paper Details
Date Published: 25 September 2013
PDF: 7 pages
Proc. SPIE 8819, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII, 881901 (25 September 2013); doi: 10.1117/12.2033971
Published in SPIE Proceedings Vol. 8819:
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII
Michael T. Postek; Ndubuisi George Orji, Editor(s)
PDF: 7 pages
Proc. SPIE 8819, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII, 881901 (25 September 2013); doi: 10.1117/12.2033971
Show Author Affiliations
Published in SPIE Proceedings Vol. 8819:
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII
Michael T. Postek; Ndubuisi George Orji, Editor(s)
© SPIE. Terms of Use
