Share Email Print
cover

Proceedings Paper

Traceability study of optical fiber degree of polarization (DOP) measurement
Author(s): Nan Xu; Jianwei Li; Jian Li; Zhixin Zhang
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Degree of polarization (DOP) is an important physical quantity for describing the optical polarization effect and is widely applied in optical fiber communication, optical fiber gyro and the related technologies. Currently, the optical polarization degree tester for the purpose of communication uses mainly two kinds of measurement methods: Stokes vector method and extremum method. At present, there isn’t a standard to measure the accuracy and consistency of DOP parameter measurement by the devices listed above, affecting seriously the application of DOP parameter measurement in the fields of optical fiber gyro and optical fiber communication. So, it is urgent to table the accurate guarantees to trace the source of quantitative values of the DOP measuring devices and testers. In this paper, the polarization beam combination method is raised to research and manufacture the standard optical fiber light source device with the variable DOP, and an indicated error measurement has been conducted for a DOP meter. A kind of standard optical fiber light source device that uses a single light source to realize the variable DOP is put forward. It is used to provide the accurate and variable optical fiber polarization degree light with a scope of 0~100%. It is used to calibrate the DOP meters and widely applied in the field of national defense and optical communication fields. By using the standard optical power meter, DOP value by which the optical power meter calculates the optical signal can be measured, which will be used ultimately for calibration of the DOP meter. A measurement uncertainty of 0.5% is obtained using the polarization beam combination method.

Paper Details

Date Published: 11 September 2013
PDF: 5 pages
Proc. SPIE 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications, 89073B (11 September 2013); doi: 10.1117/12.2033304
Show Author Affiliations
Nan Xu, National Institute of Metrology (China)
Jianwei Li, National Institute of Metrology (China)
Jian Li, National Institute of Metrology (China)
Zhixin Zhang, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 8907:
International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
Haimei Gong; Zelin Shi; Qian Chen; Jin Lu, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray