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Sensitivity enhancement of evanescent waveguide optical sensor for detecting adulterant traces in petroleum products using SiON technology
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Paper Abstract

The development of an evanescent waveguide optical sensor incorporating planar waveguide geometry using silicon oxynitride as the core layer on silica-silicon wafer and its implementation for detection of adulterant traces in petroleum products is presented in this paper. This work focuses on enhancement of sensitivity and analyzed by using Simple Effective Index Method (SEIM), based on sinusoidal modes. The embedded waveguide of length ~ 10,000 μm and core width ~ 50 μm have been developed using SiON technology and applied for checking adulteration so as to ensure the purity of the fuel such that the engine will give the desired performance including low emissions yielding better accuracy and high sensitivity within a very short pulse. The thin cladding layer acts as the analytes (mixture of adulterated fuel) that supports the waveguiding film having a refractive index smaller than that of the core. The main aim of this present work is to encompass a speedy choice to the time-consuming existing methods for detecting adulterated fuels, which generally requires some time to give the consequence. The developed sensor allows spot determination of the percentage concentration of adulterant in pure petrol without involving any chemical analysis. The waveguide based sensor is polarization independent and the sensitivity of the waveguide sensor is ~10 times more than that of the existing planar waveguide sensors and also 5 times more than that of asymmetric waveguide structure. Advantages include high sensitivity, simple fabrication and easy interrogation without involving the use of solvents or toxic chemicals.

Paper Details

Date Published: 18 November 2013
PDF: 6 pages
Proc. SPIE 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications, 8785BW (18 November 2013); doi: 10.1117/12.2026242
Show Author Affiliations
Aradhana Dutta, Tezpur Univ. (India)
Bidyut Deka, Tezpur Univ. (India)
Partha Pratim Sahu, Tezpur Univ. (India)

Published in SPIE Proceedings Vol. 8785:
8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications
Manuel Filipe P. C. Martins Costa, Editor(s)

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