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Proceedings Paper

White light interferometry applied to wavelength calibration of spectrometers
Author(s): Héctor González-Núñez; Raúl de la Fuente
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Paper Abstract

In this work, white light interferometry is applied to perform wavelength calibration of a dispersive spectrometer .The relation between wavelength and position in the spectrometer detector is obtained from the wavelength-dependent phase difference at the output of the interferometer. In the proposed method, no suppositions are made about the spectrum of the illumination source; it is only required to make a simple assumption about dispersion in the spectrometer to be measured and to perform a Taylor expansion of the phase difference. A sample of calibration of a home-made spectrometer serves to discuss different issues that affect the calibration.

Paper Details

Date Published: 18 November 2013
PDF: 6 pages
Proc. SPIE 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications, 87854G (18 November 2013); doi: 10.1117/12.2026187
Show Author Affiliations
Héctor González-Núñez, Univ. de Santiago de Compostela (Spain)
Raúl de la Fuente, Univ. de Santiago de Compostela (Spain)


Published in SPIE Proceedings Vol. 8785:
8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications
Manuel Filipe P. C. Martins Costa, Editor(s)

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