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Proceedings Paper

Morphologic evaluation of thin films by algorithms of optical phase stepping applied to images obtained by interferential microscopy
Author(s): Valentin Sarmiento; Miguel Asmad; J. Ivan Choque; Guillermo Baldwin
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Paper Abstract

The characterization of the superficial topography of a thin film, obtained from an interferometer installed in our Optics Laboratory, is done using bi-dimensional images of its surface overlaid with interference fringes (interferogram1). These images differ among them only by a constant variation of the optical phase2. The total number of images to acquire depends on the image processing algorithm to apply; this algorithm allows to determine the value of the phase introduced by the surface form.

Paper Details

Date Published: 18 November 2013
PDF: 5 pages
Proc. SPIE 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications, 87856U (18 November 2013); doi: 10.1117/12.2025981
Show Author Affiliations
Valentin Sarmiento, Pontificia Univ. Católica del Perú (Peru)
Miguel Asmad, Pontificia Univ. Católica del Perú (Peru)
J. Ivan Choque, Pontificia Univ. Católica del Perú (Peru)
Guillermo Baldwin, Pontificia Univ. Católica del Perú (Peru)


Published in SPIE Proceedings Vol. 8785:
8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications
Manuel Filipe P. C. Martins Costa, Editor(s)

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