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Proceedings Paper

Stereo matching image processing by selected finite length edge line matching on least square method
Author(s): Akira Akiyama; Nobuaki Kobayashi; Eiichiro Mutoh; Hideo Kumagai
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Paper Abstract

We have developed the stereo matching image processing by selected finite length edge line matching on least square method to find the local distance information of the view. This method is based on a pair of the high pass wavelet images to find out the matching edge line. These high pass wavelet images are also used to choose the focused images by applying threshold operation on them. Each imager has the function for focusing, changing view angle and changing aperture by the servomotors and microcomputers. It is mounted on the gimbal unit to make the independent yaw and pitch movement. And a pair of imagers is mounted on the yaw gimbal to make the same yaw movement. The matching edge line for matching process is derived from making the 2-valued high pass image with correspondence for focused image, grouping high valued pixels in the 2 valued high pass image by 8 directional connectivity rule, thinning the grouped image by Hilditch thinning method, tracing the thinned line image for numbering pixels on the line continuously, calculating the line linearity by the least square method at each pixel point with adjacent finite number of pixel points, finding out the line segments to have linearity within the limited root mean square of the difference between the line by least square method and the thinned line segment, constructing the standard matching edge line by reducing the number of the pixels of matching edge line for the tolerance of matching due to the deformation between a pair of images. The selected standard matching edge line is evaluated by autocorrelation on the standard thinned line image to check the existence of similar line segments. Under the information of autocorrelation the edge line matching is evaluated by moving the pixel point through paired thinned line image by calculating the root mean square of the difference between them.

Paper Details

Date Published: 30 September 2013
PDF: 8 pages
Proc. SPIE 8842, Novel Optical Systems Design and Optimization XVI, 88420S (30 September 2013); doi: 10.1117/12.2023888
Show Author Affiliations
Akira Akiyama, Kanazawa Technical College (Japan)
Nobuaki Kobayashi, Kanazawa Institute of Technology (Japan)
Eiichiro Mutoh, Kawasaki Heavy Industries Ltd. (Japan)
Hideo Kumagai, Tamagawa Seiki Co., Ltd. (Japan)

Published in SPIE Proceedings Vol. 8842:
Novel Optical Systems Design and Optimization XVI
G. Groot Gregory; Arthur J. Davis, Editor(s)

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