Share Email Print

Proceedings Paper

Full-field transmission-type angle deviation microscopes
Author(s): Ming-Hung Chiu; Ming-Hung Tsai
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We proposed a three-dimensional (3-D) microscope with a magnification of 50X based on the principle of angle deviation microscopy for measuring the transparent materials. We utilized a parallel beam like uncountable probes to sense a specimen. After sensing, each light may be deflected a small angle due to the non-smooth surface or/and the change of refractive index. A parallelogram prism is used to acquiring all the deflective angles by measuring the reflectivity of prism based on the critical angle method. Thus, the surface height is proportional to the deflective angle and the reflectivity. Using two CCDs is to record the intensity patterns on conditions of TIR and the critical angle, respectively. The CCDs are located at the image planes, one is in the TIR path, and the other is in the critical angle path, respectively. Thus, the reflectivity pattern can be calculated and transformed into the 3-D surface profile. In our experiment, the lateral and vertical resolutions can be demonstrated within submicron and 1 nm, respectively.

Paper Details

Date Published: 6 September 2013
PDF: 9 pages
Proc. SPIE 8839, Dimensional Optical Metrology and Inspection for Practical Applications II, 88390O (6 September 2013); doi: 10.1117/12.2022954
Show Author Affiliations
Ming-Hung Chiu, National Formosa Univ. (Taiwan)
Ming-Hung Tsai, National Formosa Univ. (Taiwan)

Published in SPIE Proceedings Vol. 8839:
Dimensional Optical Metrology and Inspection for Practical Applications II
Kevin G. Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?