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Proceedings Paper

Thermal Quasi-Reflectography (TQR): current research and potential applications
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Paper Abstract

Thermal Quasi Reflectography (TQR), e.g. imaging in the thermal band 3-5 μm (MWIR), is discussed as innovative tool for the noninvasive analysis of pictorial surface layers in artworks, and its potential is demonstrated in some applications. The results encourage further developments in this field. The novel experimental technique, which has been recently introduced by the authors, is reviewed here giving focus to current research and potential applications.

Paper Details

Date Published: 30 May 2013
PDF: 10 pages
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900S (30 May 2013); doi: 10.1117/12.2022155
Show Author Affiliations
Claudia Daffara, Univ. degli Studi di Verona (Italy)
Dario Ambrosini, Univ. degli Studi dell'Aquila (Italy)
Luca Pezzati, Istituto Nazionale di Ottica, CNR (Italy)
Giacomo Marchioro, Univ. degli Studi di Verona (Italy)


Published in SPIE Proceedings Vol. 8790:
Optics for Arts, Architecture, and Archaeology IV
Luca Pezzati; Piotr Targowski, Editor(s)

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