Share Email Print

Proceedings Paper

The influence of nonlinear modal propagation analysis on MMI power splitters for miniaturization
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This study investigates a method to access the power splitting performances of multimode interference waveguides based on analytical nonlinear modal propagation analysis method in the presence of the Kerr nonlinear effect for device miniaturization. Nonlinear multimode interference waveguide has been already reported in a few work based on beam propagation analysis (BPM) for make a special path with intense input for switching purposes. BPM method does not seem a capable method for study the multimode waveguide performance in small lengths. Therefore, we established the nonlinear modal propagation analysis on the way that is determined based on the propagation of all nonlinear guided modes throughout the medium whereas this shows the amplitude and phase changes of the guided modes. In fact mentioned change lead to induction of nonlinearity on original guided modes and make them nonlinear. In this paper, the nonlinear guided modes which are excitedfrom input beam are measured with solve the nonlinear differential equation. Intensity distribution among the multimode waveguide as a simulation tool assist us to show the possibility to access to 1×N power splitters whereas they operate on small lengths in comparison with past reports in linear regimes. In fact the formation of parallel self- images determined the outputs for splitter and the resolution and contrast of image show the uniformity and insertion loss that result demonstrate desirable uniformity and insertion loss so that miniaturization does not decrease the performance. Also the simulation result shows proposed active device is more sensitive to the input intensity. This sensitive can be a foundation for propose an arbitrary power splitter ratio devices.

Paper Details

Date Published: 13 May 2013
PDF: 4 pages
Proc. SPIE 8789, Modeling Aspects in Optical Metrology IV, 87890P (13 May 2013); doi: 10.1117/12.2021558
Show Author Affiliations
M. Tajaldini, Univ. Sains Malaysia (Malaysia)
M. Z. Mat Jafri, Univ. Sains Malaysia (Malaysia)

Published in SPIE Proceedings Vol. 8789:
Modeling Aspects in Optical Metrology IV
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?