
Proceedings Paper
Synthesis and characterization of large optical grade sapphire windows produced from a horizontal growth processFormat | Member Price | Non-Member Price |
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Paper Abstract
As sensor technology and applications have advanced over the years, the size of sensor windows has grown substantially to satisfy current and future demands. Rubicon Technology, with their strong history in scaling sapphire crystal growth and large scale production processes, has successfully produced large sapphire blanks using a highly modified horizontal directional solidification process. Several prototypes have been synthesized up to 1.75 inches thick, 14 inches wide and 20 inches long. Crystal properties and optical characteristics such as transmission and refractive index homogeneity will be presented on several polished bubble-free windows with excellent results. This research sets the standard for high quality monolithic sapphire sheets large enough for use as seamless integrated optical windows in both military and civilian applications.
Paper Details
Date Published: 4 June 2013
PDF: 6 pages
Proc. SPIE 8708, Window and Dome Technologies and Materials XIII, 87080C (4 June 2013); doi: 10.1117/12.2021158
Published in SPIE Proceedings Vol. 8708:
Window and Dome Technologies and Materials XIII
Randal W. Tustison; Brian J. Zelinski, Editor(s)
PDF: 6 pages
Proc. SPIE 8708, Window and Dome Technologies and Materials XIII, 87080C (4 June 2013); doi: 10.1117/12.2021158
Show Author Affiliations
Jonathan B. Levine, Rubicon Technology Inc. (United States)
Timothy Burks, Rubicon Technology Inc. (United States)
John Ciraldo, Rubicon Technology Inc. (United States)
Timothy Burks, Rubicon Technology Inc. (United States)
John Ciraldo, Rubicon Technology Inc. (United States)
Matthew Montgomery, Rubicon Technology Inc. (United States)
Andrey Novoselov, Rubicon Technology Inc. (United States)
Sergey Podlozhenov, Rubicon Technology Inc. (United States)
Andrey Novoselov, Rubicon Technology Inc. (United States)
Sergey Podlozhenov, Rubicon Technology Inc. (United States)
Published in SPIE Proceedings Vol. 8708:
Window and Dome Technologies and Materials XIII
Randal W. Tustison; Brian J. Zelinski, Editor(s)
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