
Proceedings Paper
Method for image quality improvement of full-color holographic projection systemFormat | Member Price | Non-Member Price |
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Paper Abstract
In the optoelectronic reconstruction of full-color hologram, transverse and longitudinal chromatisms are introduced due
to the hologram is sensitive to wavelength, which makes the colorful image fuzzy. The image quality is also affected by
the characteristic of the spatial light modulator used in optoelectronic projection system. Multi-order diffraction images
occurred due to the ratio of active area and dead area (fill rate). In the colorful holographic projection system, three lasers
with red, green, and blue color are applied as the light sources, color crosstalk due to the switching of the different lasers
also impairs the image quality. In order to improving the image quality of full color holographic projection system, this
paper analyzes the effect of the fill rate and the color crosstalk on the reconstruction image quality. Transverse and
longitudinal chromatisms are removed by resampling the object information and loading a specially designed virtual
phase distribution in the computer hologram respectively. We proposed time sequence updating chart of RGB laser to
solve the problem of color crosstalk. Experimental results are also provided to verify the improvement of the image
quality.
Paper Details
Date Published: 22 June 2013
PDF: 7 pages
Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 876939 (22 June 2013); doi: 10.1117/12.2021070
Published in SPIE Proceedings Vol. 8769:
International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
Chenggen Quan; Kemao Qian; Anand Asundi, Editor(s)
PDF: 7 pages
Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 876939 (22 June 2013); doi: 10.1117/12.2021070
Show Author Affiliations
Huadong Zheng, Shanghai Univ. (China)
Zhenxiang Zeng, Shanghai Univ. (China)
Tao Wang, Shanghai Univ. (China)
Zhenxiang Zeng, Shanghai Univ. (China)
Tao Wang, Shanghai Univ. (China)
Chi Wang, Shanghai Univ. (China)
Yingjie Yu, Shanghai Univ. (China)
Yingjie Yu, Shanghai Univ. (China)
Published in SPIE Proceedings Vol. 8769:
International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
Chenggen Quan; Kemao Qian; Anand Asundi, Editor(s)
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