
Proceedings Paper
Tilted objects EFI in digital holography by two different numerical approachesFormat | Member Price | Non-Member Price |
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Paper Abstract
Limited depth of field (DOF) is one of the main shortage for many optical imaging systems. This is a limitation that
precludes to get in focus, in a single plane, objects that are located at different distances, but that fall in the same field of
view. Furthermore, the depth of field is reduced as much as greater is the requirement for a high magnification and to
obtain an extended focus image (EFI) of these objects remains one of the major challenges. In this work we propose and
compare two different approaches to build the EFI of holograms recorded on a tilted plane. In the first case, a simplified
three-dimensional (3D) formulation of the angular spectrum method (ASM) is proposed. It allows to generate the entire
stack of propagated images in a single shot. In the second approach, a numerical cubic phase plate (CPP) is included into
the reconstruction process of digital holograms with the aim to enhancing DOF of optical imaging system. Theoretical
formulations of the two approaches are supported by experimental evidences. The obtained results show that the
proposed strategies allow to reconstruct effectively an EFI from holograms recorded on an inclined plane.
Paper Details
Date Published: 13 May 2013
PDF: 8 pages
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882Z (13 May 2013); doi: 10.1117/12.2020923
Published in SPIE Proceedings Vol. 8788:
Optical Measurement Systems for Industrial Inspection VIII
Peter H. Lehmann; Wolfgang Osten; Armando Albertazzi, Editor(s)
PDF: 8 pages
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882Z (13 May 2013); doi: 10.1117/12.2020923
Show Author Affiliations
Marcella Matrecano, CNR-Istituto Nazionale di Ottica (Italy)
Melania Paturzo, CNR-Istituto Nazionale di Ottica (Italy)
Melania Paturzo, CNR-Istituto Nazionale di Ottica (Italy)
Pietro Ferraro, CNR-Istituto Nazionale di Ottica (Italy)
Published in SPIE Proceedings Vol. 8788:
Optical Measurement Systems for Industrial Inspection VIII
Peter H. Lehmann; Wolfgang Osten; Armando Albertazzi, Editor(s)
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