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Proceedings Paper

Status of detector development for the European XFEL
Author(s): Jolanta Sztuk-Dambietz; Steffen Hauf; Andreas Koch; Markus Kuster; Monica Turcato
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Paper Abstract

The European X-ray Free Electron Laser (XFEL.EU) will provide as-yet-unrivaled peak brilliance and ultrashort pulses of spatially coherent X-rays with a pulse length of less than 100 fs in the energy range between 0.25 and 25 keV. The high radiation intensity and ultra-short pulse duration will open a window for novel scientific techniques and will allow to explore new phenomena in biology, chemistry, material science, as well as matter at high energy density, atomic, ion and molecular physics. The variety of scientific applications and especially the unique XFEL.EU time structure require adequate instrumentation to be developed in order to exploit the full potential of the light source. To make optimal use of the unprecedented capabilities of the European XFEL and master these vast technological challenges, the European XFEL GmbH has started a detector R and D program. The technology concepts of the detector system presently under development are complementary in their performance and will cover the requirements of a large fraction of the scientific applications envisaged for the XFEL.EU facility. The actual status of the detector development projects which includes ultra-fast 2D imaging detectors, low repetition rate 2D detectors as well as strip detectors for e.g. spectroscopy applications and the infrastructure for the detectors’ calibration and tests will be presented. Furthermore, an overview of the forthcoming implementation phase of the European XFEL in terms of detector R and D will be given.

Paper Details

Date Published: 3 May 2013
PDF: 13 pages
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87780U (3 May 2013); doi: 10.1117/12.2020773
Show Author Affiliations
Jolanta Sztuk-Dambietz, European XFEL GmbH (Germany)
Steffen Hauf, European XFEL GmbH (Germany)
Andreas Koch, European XFEL GmbH (Germany)
Markus Kuster, European XFEL GmbH (Germany)
Monica Turcato, European XFEL GmbH (Germany)

Published in SPIE Proceedings Vol. 8778:
Advances in X-ray Free-Electron Lasers II: Instrumentation
Thomas Tschentscher; Kai Tiedtke, Editor(s)

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