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Proceedings Paper

Optical characterization method for very small microlenses (sub-50 micron) for industrial mass-production applications
Author(s): Myun-Sik Kim; Jonathan Sunarjo; Kenneth J. Weible; Reinhard Voelkel
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Paper Abstract

We present several characterization techniques, which are suitable for small-size microlenses of lens diameters down to 5 μm. For an individual microlens, we apply full characterization for optical performance and surface characteristics. First, the optical performance is characterized by using a high-resolution interference microscope (HRIM). Second, a confocal microscope is applied to investigate the surface parameters. Third, the HRIM allows scanning the microlens array along the optical axis by using a piezo actuator. This leads to a measurement of the 3D intensity distribution near the focus of the lens. Such 3D intensity maps allow us to characterize the focal properties of each lens in an array. By studying those characterization techniques, we develop a new method to characterize a large number of microlenses, for instance, over one million lenses, which is already applied to wafer-based manufacturing in a cleanroom fab.

Paper Details

Date Published: 13 May 2013
PDF: 8 pages
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880G (13 May 2013); doi: 10.1117/12.2020589
Show Author Affiliations
Myun-Sik Kim, SUSS MicroOptics SA (Switzerland)
Jonathan Sunarjo, SUSS MicroOptics SA (Switzerland)
Kenneth J. Weible, SUSS MicroOptics SA (Switzerland)
Reinhard Voelkel, SUSS MicroOptics SA (Switzerland)

Published in SPIE Proceedings Vol. 8788:
Optical Measurement Systems for Industrial Inspection VIII
Peter H. Lehmann; Wolfgang Osten; Armando Albertazzi, Editor(s)

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