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Proceedings Paper

Inspecting rapidly moving surfaces for small defects using CNN cameras
Author(s): Andreas Blug; Daniel Carl; Heinrich Höfler
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Paper Abstract

A continuous increase in production speed and manufacturing precision raises a demand for the automated detection of small image features on rapidly moving surfaces. An example are wire drawing processes where kilometers of cylindrical metal surfaces moving with 10 m/s have to be inspected for defects such as scratches, dents, grooves, or chatter marks with a lateral size of 100 μm in real time. Up to now, complex eddy current systems are used for quality control instead of line cameras, because the ratio between lateral feature size and surface speed is limited by the data transport between camera and computer. This bottleneck is avoided by “cellular neural network” (CNN) cameras which enable image processing directly on the camera chip. This article reports results achieved with a demonstrator based on this novel analogue camera – computer system. The results show that computational speed and accuracy of the analogue computer system are sufficient to detect and discriminate the different types of defects. Area images with 176 x 144 pixels are acquired and evaluated in real time with frame rates of 4 to 10 kHz – depending on the number of defects to be detected. These frame rates correspond to equivalent line rates on line cameras between 360 and 880 kHz, a number far beyond the available features. Using the relation between lateral feature size and surface speed as a figure of merit, the CNN based system outperforms conventional image processing systems by an order of magnitude.

Paper Details

Date Published: 24 May 2013
PDF: 11 pages
Proc. SPIE 8791, Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection, 87911D (24 May 2013); doi: 10.1117/12.2020568
Show Author Affiliations
Andreas Blug, Fraunhofer-Institut für Physikalische Messtechnik (Germany)
Daniel Carl, Fraunhofer-Institut für Physikalische Messtechnik (Germany)
Heinrich Höfler, Fraunhofer-Institut für Physikalische Messtechnik (Germany)

Published in SPIE Proceedings Vol. 8791:
Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection
Fabio Remondino; Jürgen Beyerer; Fernando Puente León; Mark R. Shortis, Editor(s)

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