Share Email Print

Proceedings Paper

High-speed 3D shape measurement using array projection
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Measuring the three-dimensional (3D) surface shape of objects in real time has become an important task e.g. in industrial quality management or medical sciences. Stereo vision-based arrangements in connection with pattern projection offer high data acquisition speed and low computation time. However, these coded-light techniques are limited by the projection speed which is conventionally in the range of 200. . .250Hz. In this contribution, we present the concepts and a realized setup of a so-called 3D array projector. It is ultra-slim, but nonetheless able to project fixed patterns with high brightness and depth of focus. Furthermore, frame rates up to the 100 kHz range are achievable without any need of mechanically moving parts since the projection speed is limited mainly by the switching frequency of the used LEDs. According to the measurement requirements, type and structure of the patterns can be chosen almost freely: linear or sinusoidal fringes, binary codes such as the Gray code, square, hexagonal or random patterns and many more. First investigations on the functionality of such a 3D array projector were conducted using a prototype with a combination of Gray codes and phase-shifted sinusoidal fringes. Our contribution proves the high brightness of the proposed projector, its sharpness and the good Michelson contrast of the fringe patterns. We deal with the patterns’ homogeneity and the accuracy of the phase shift between the sinusoidal patterns. Furthermore, we present first measurement results and outline future research which is, inter alia, addressed to the use of other structured light techniques with the help of new purpose-built 3D array projector prototypes.

Paper Details

Date Published: 13 May 2013
PDF: 11 pages
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878815 (13 May 2013); doi: 10.1117/12.2020539
Show Author Affiliations
Stefan Heist, Fraunhofer IOF (Germany)
Marcel Sieler, Fraunhofer IOF (Germany)
Andreas Breitbarth, Fraunhofer IOF (Germany)
Peter Kühmstedt, Fraunhofer IOF (Germany)
Gunther Notni, Fraunhofer IOF (Germany)

Published in SPIE Proceedings Vol. 8788:
Optical Measurement Systems for Industrial Inspection VIII
Peter H. Lehmann; Wolfgang Osten; Armando Albertazzi, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?