
Proceedings Paper
A space-borne fiber-optic interrogator module based on narrow-band tunable laser diode for temperature monitoring in telecommunication satellitesFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper measurement results of the fiber-optic interrogator module for telecommunication satellite applications are presented. The sensor interrogator features from fiber Bragg grating (FBG) based sensing. Benefits are intrinsic sensor distribution capability and the possibility to embed optical fibers in composite structures like tanks and satellite panels.
The fiber-optic interrogator module is based on a narrow-band monolithic laser diode where the output wavelength is spectrally tuned by electric control signals. By evaluating the intensities of the sensor response, the peak of the FBG can be monitored. The correct evaluation of the sensor response is a challenging task, therefore different computational methods are presented, namely centroid, finite impulse response filter and curve fitting algorithms. The algorithms shall met the performance requirements in terms of measurement accuracy, robustness against laser degradation and measurement rate. Furthermore the algorithms shall be implemented in an FPGA, which means a detailed point of view to fixed-point arithmetic and necessary amount of hardware resources at constant performance.
Measurement results based on the different FBG evaluation algorithms are presented and traded regarding accuracy robustness and their possible implementation in an FPGA.
Paper Details
Date Published: 13 May 2013
PDF: 10 pages
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878810 (13 May 2013); doi: 10.1117/12.2020495
Published in SPIE Proceedings Vol. 8788:
Optical Measurement Systems for Industrial Inspection VIII
Peter H. Lehmann; Wolfgang Osten; Armando Albertazzi, Editor(s)
PDF: 10 pages
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878810 (13 May 2013); doi: 10.1117/12.2020495
Show Author Affiliations
P. Putzer, Technische Univ. München (Germany)
N. Kuhenuri, Technische Univ. München (Germany)
A. W. Koch, Technische Univ. München (Germany)
N. Kuhenuri, Technische Univ. München (Germany)
A. W. Koch, Technische Univ. München (Germany)
S. Schweyer, Kayser-Threde GmbH (Germany)
A. Hurni, Kayser-Threde GmbH (Germany)
M. Plattner, Kayser-Threde GmbH (Germany)
A. Hurni, Kayser-Threde GmbH (Germany)
M. Plattner, Kayser-Threde GmbH (Germany)
Published in SPIE Proceedings Vol. 8788:
Optical Measurement Systems for Industrial Inspection VIII
Peter H. Lehmann; Wolfgang Osten; Armando Albertazzi, Editor(s)
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