
Proceedings Paper
A photogrammetric approach to survey floating and semi-submerged objectsFormat | Member Price | Non-Member Price |
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Paper Abstract
The article presents an innovative methodology for the 3D surveying and modeling of floating and semi-submerged objects. Photogrammetry is used for surveying both the underwater and emerged parts of the object and the two surveys are combined together by means of special rigid orientation devices. The proposed methodology is firstly applied to a small pleasure boats (approximately 6 meters long) - hence a free floating case - and then to a large shipwreck (almost 300 meters long) interested by a 52 m long leak at the waterline. The article covers the entire workflow, starting from the camera calibration and data acquisition down to the assessment of the achieved accuracy, the realization of the digital 3D model by means of dense image matching procedures as well as deformation analyses and comparison with the craft original plane.
Paper Details
Date Published: 23 May 2013
PDF: 15 pages
Proc. SPIE 8791, Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection, 87910H (23 May 2013); doi: 10.1117/12.2020464
Published in SPIE Proceedings Vol. 8791:
Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection
Fabio Remondino; Jürgen Beyerer; Fernando Puente León; Mark R. Shortis, Editor(s)
PDF: 15 pages
Proc. SPIE 8791, Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection, 87910H (23 May 2013); doi: 10.1117/12.2020464
Show Author Affiliations
Fabio Menna, Fondazione Bruno Kessler (Italy)
Erica Nocerino, Fondazione Bruno Kessler (Italy)
Univ. degli Studi di Napoli Parthenope (Italy)
Erica Nocerino, Fondazione Bruno Kessler (Italy)
Univ. degli Studi di Napoli Parthenope (Italy)
Salvatore Troisi, Univ. degli Studi di Napoli Parthenope (Italy)
Fabio Remondino, Fondazione Bruno Kessler (Italy)
Fabio Remondino, Fondazione Bruno Kessler (Italy)
Published in SPIE Proceedings Vol. 8791:
Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection
Fabio Remondino; Jürgen Beyerer; Fernando Puente León; Mark R. Shortis, Editor(s)
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