
Proceedings Paper
Automated hardware and software complex for extended light sources verificationFormat | Member Price | Non-Member Price |
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Paper Abstract
For today the development in lighting technologies, in particular the creation of powerful extended and multicomponent
sources, occupies a leading position in the field of innovation. The development of mentioned lighting devices is not
possible without providing of careful control for parameters and characteristics both of the each source’s emitting
element and of the entire lighting device as a whole. There are many various devices and measuring complexes, intended
for verification and evaluation of extended and multicomponent light sources parameters and characteristics. However,
none of them enables the simultaneous analysis of the spatial distribution of illuminance, color and spectral
characteristics as well as power settings parameters of extended or multicomponent light sources. This problem can be
solved by using of automated hardware and software complex for extended light sources verification, developed by the employees of the chair of optical-electronic devices and systems of St.-Petersburg national research university of
information technologies, mechanics and optics in Russia. The paper presents the theoretical and practical aspects of the extended and multicomponent light sources spectral and color characteristics analysis as well as the results of
illuminance distribution investigation in three-dimensional space for some kinds of light sources. In addition, we present the experimental results of several types of extended and multicomponent light sources with different shape, order and quantity of the emitting elements, spectral and energy characteristics of the radiation.
Paper Details
Date Published: 13 May 2013
PDF: 9 pages
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883Q (13 May 2013); doi: 10.1117/12.2020458
Published in SPIE Proceedings Vol. 8788:
Optical Measurement Systems for Industrial Inspection VIII
Peter H. Lehmann; Wolfgang Osten; Armando Albertazzi, Editor(s)
PDF: 9 pages
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883Q (13 May 2013); doi: 10.1117/12.2020458
Show Author Affiliations
Elena V. Gorbunova, National Research Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Vladimir S. Peretyagin, National Research Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Vladimir S. Peretyagin, National Research Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Aleksandr N. Chertov, National Research Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Published in SPIE Proceedings Vol. 8788:
Optical Measurement Systems for Industrial Inspection VIII
Peter H. Lehmann; Wolfgang Osten; Armando Albertazzi, Editor(s)
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