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Proceedings Paper

Automated full-3D digitization system for documentation of paintings
Author(s): Maciej Karaszewski; Marcin Adamczyk; Robert Sitnik; Jakub Michoński; Wojciech Załuski; Eryk Bunsch; Paweł Bolewicki
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Paper Abstract

In this paper, a fully automated 3D digitization system for documentation of paintings is presented. It consists of a specially designed frame system for secure fixing of painting, a custom designed, structured light-based, high-resolution measurement head with no IR and UV emission. This device is automatically positioned in two axes (parallel to the surface of digitized painting) with additional manual positioning in third, perpendicular axis. Manual change of observation angle is also possible around two axes to re-measure even partially shadowed areas. The whole system is built in a way which provides full protection of digitized object (moving elements cannot reach its vicinity) and is driven by computer-controlled, highly precise servomechanisms. It can be used for automatic (without any user attention) and fast measurement of the paintings with some limitation to their properties: maximum size of the picture is 2000mm x 2000mm (with deviation of flatness smaller than 20mm) Measurement head is automatically calibrated by the system and its possible working volume starts from 50mm x 50mm x 20mm (10000 points per square mm) and ends at 120mm x 80mm x 60mm (2500 points per square mm). The directional measurements obtained with this system are automatically initially aligned due to the measurement head’s position coordinates known from servomechanisms. After the whole painting is digitized, the measurements are fine-aligned with color-based ICP algorithm to remove any influence of possible inaccuracy of positioning devices. We present exemplary digitization results along with the discussion about the opportunities of analysis which appear for such high-resolution, 3D computer models of paintings.

Paper Details

Date Published: 30 May 2013
PDF: 11 pages
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900X (30 May 2013); doi: 10.1117/12.2020447
Show Author Affiliations
Maciej Karaszewski, Warsaw Univ. of Technology (Poland)
Marcin Adamczyk, Warsaw Univ. of Technology (Poland)
Robert Sitnik, Warsaw Univ. of Technology (Poland)
Jakub Michoński, Warsaw Univ. of Technology (Poland)
Wojciech Załuski, Warsaw Univ. of Technology (Poland)
Eryk Bunsch, Wilanow Palace Museum (Poland)
Paweł Bolewicki, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 8790:
Optics for Arts, Architecture, and Archaeology IV
Luca Pezzati; Piotr Targowski, Editor(s)

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