
Proceedings Paper
Efficient and stable numerical method for evaluation of Zernike polynomials and their Cartesian derivativesFormat | Member Price | Non-Member Price |
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Paper Abstract
Our work is focused on a problem of numerical evaluation of Zernike polynomials and their Cartesian partial derivatives.
Since the direct calculation using explicit definition relations is relatively slow and it is numerically instable for higher
orders of evaluated polynomials there is a need for a more effective and stable method. In recent years several recurrent
methods were developed for numerical evaluation of Zernike polynomials. These methods are numerically stable up to
very high orders and they are much faster than direct calculation. In our work a brief review of the existing methods for calculation of Zernike polynomials is given and then an analogous recurrence method for evaluation of x and y partial derivatives of Zernike polynomials is proposed. The numerical stability of this method and the comparison of
computation time with respect to the direct method is presented using computer simulations. The proposed method can be used e.g. in optical modeling for expressing the shape of optical surfaces or in optical measurement methods based on the wavefront gradient measurements (Shack-Hartmann wavefront sensor, pyramidal sensor or shearing interferometry), where modal wavefront reconstruction using Zernike polynomials is often used.
Paper Details
Date Published: 13 May 2013
PDF: 8 pages
Proc. SPIE 8789, Modeling Aspects in Optical Metrology IV, 878913 (13 May 2013); doi: 10.1117/12.2020389
Published in SPIE Proceedings Vol. 8789:
Modeling Aspects in Optical Metrology IV
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)
PDF: 8 pages
Proc. SPIE 8789, Modeling Aspects in Optical Metrology IV, 878913 (13 May 2013); doi: 10.1117/12.2020389
Show Author Affiliations
Pavel Novák, Czech Technical Univ. in Prague (Czech Republic)
Jíří Novák, Czech Technical Univ. in Prague (Czech Republic)
Published in SPIE Proceedings Vol. 8789:
Modeling Aspects in Optical Metrology IV
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)
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