Share Email Print

Proceedings Paper

Measurement uncertainty in the profile detection on solar troughs
Author(s): P. Sansoni; D. Fontani; F. Francini; S. Toccafondi; M. Messeri; S. Coraggia; L. Mercatelli; D. Jafrancesco; E. Sani
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Surface profile control on solar concentrators is fundamental since the mirror can be imperfectly manufactured. Optical profilometric measurements are generally addressed to detect small localised irregularities. The paper presents an optical profilometer for linear solar collectors, which are typically employed in thermal plants and more recently in concentrating photovoltaic systems. The profilometer includes a source of parallel rays and a target placed at the collector focal distance. It was developed simulating profile measurements on linear parabolic mirrors; then the method was validated by tests on a practical realisation. The device examines the reflector surface operating on a plane transversal to the linear collector axis; then the detection is repeated displacing the optical profilometer along the collector axis. This experimentation allowed to deeply examine and reduce the errors of the measurement procedure.

Paper Details

Date Published: 13 May 2013
PDF: 11 pages
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882E (13 May 2013); doi: 10.1117/12.2020285
Show Author Affiliations
P. Sansoni, CNR-Istituto Nazionale di Ottica (Italy)
D. Fontani, CNR-Istituto Nazionale di Ottica (Italy)
F. Francini, CNR-Istituto Nazionale di Ottica (Italy)
S. Toccafondi, Univ. of Florence (Italy)
M. Messeri, Univ. of Florence (Italy)
S. Coraggia, CNR-Istituto Nazionale di Ottica (Italy)
L. Mercatelli, CNR-Istituto Nazionale di Ottica (Italy)
D. Jafrancesco, CNR-Istituto Nazionale di Ottica (Italy)
E. Sani, CNR-Istituto Nazionale di Ottica (Italy)

Published in SPIE Proceedings Vol. 8788:
Optical Measurement Systems for Industrial Inspection VIII
Peter H. Lehmann; Wolfgang Osten; Armando Albertazzi, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?