
Proceedings Paper
Measurement uncertainty in the profile detection on solar troughsFormat | Member Price | Non-Member Price |
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Paper Abstract
Surface profile control on solar concentrators is fundamental since the mirror can be imperfectly
manufactured. Optical profilometric measurements are generally addressed to detect small localised
irregularities. The paper presents an optical profilometer for linear solar collectors, which are typically
employed in thermal plants and more recently in concentrating photovoltaic systems. The profilometer
includes a source of parallel rays and a target placed at the collector focal distance. It was developed
simulating profile measurements on linear parabolic mirrors; then the method was validated by tests on a
practical realisation. The device examines the reflector surface operating on a plane transversal to the linear
collector axis; then the detection is repeated displacing the optical profilometer along the collector axis. This
experimentation allowed to deeply examine and reduce the errors of the measurement procedure.
Paper Details
Date Published: 13 May 2013
PDF: 11 pages
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882E (13 May 2013); doi: 10.1117/12.2020285
Published in SPIE Proceedings Vol. 8788:
Optical Measurement Systems for Industrial Inspection VIII
Peter H. Lehmann; Wolfgang Osten; Armando Albertazzi, Editor(s)
PDF: 11 pages
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882E (13 May 2013); doi: 10.1117/12.2020285
Show Author Affiliations
P. Sansoni, CNR-Istituto Nazionale di Ottica (Italy)
D. Fontani, CNR-Istituto Nazionale di Ottica (Italy)
F. Francini, CNR-Istituto Nazionale di Ottica (Italy)
S. Toccafondi, Univ. of Florence (Italy)
M. Messeri, Univ. of Florence (Italy)
D. Fontani, CNR-Istituto Nazionale di Ottica (Italy)
F. Francini, CNR-Istituto Nazionale di Ottica (Italy)
S. Toccafondi, Univ. of Florence (Italy)
M. Messeri, Univ. of Florence (Italy)
S. Coraggia, CNR-Istituto Nazionale di Ottica (Italy)
L. Mercatelli, CNR-Istituto Nazionale di Ottica (Italy)
D. Jafrancesco, CNR-Istituto Nazionale di Ottica (Italy)
E. Sani, CNR-Istituto Nazionale di Ottica (Italy)
L. Mercatelli, CNR-Istituto Nazionale di Ottica (Italy)
D. Jafrancesco, CNR-Istituto Nazionale di Ottica (Italy)
E. Sani, CNR-Istituto Nazionale di Ottica (Italy)
Published in SPIE Proceedings Vol. 8788:
Optical Measurement Systems for Industrial Inspection VIII
Peter H. Lehmann; Wolfgang Osten; Armando Albertazzi, Editor(s)
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