
Proceedings Paper
Nokia PureView oversampling technologyFormat | Member Price | Non-Member Price |
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Paper Abstract
This paper describes Nokia’s PureView oversampling imaging technology as well as the product, Nokia 808 PureView,
featuring it. The Nokia PureView imaging technology is the combination of a large, super high resolution 41Mpix with
high performance Carl Zeiss optics. Large sensor enables a pixel oversampling technique that reduces an image taken at
full resolution into a lower resolution picture, thus achieving higher definition and light sensitivity. One oversampled
super pixel in image file is formed by using many sensor pixels. A large sensor enables also a lossless zoom. If a user
wants to use the lossless zoom, the sensor image is cropped. However, up-scaling is not needed as in traditional digital
zooming usually used in mobile devices. Lossless zooming means image quality that does not have the digital zooming
artifacts as well as no optical zooming artifacts like zoom lens system distortions. Zooming with PureView is also
completely silent. PureView imaging technology is the result of many years of research and development and the
tangible fruits of this work are exceptional image quality, lossless zoom, and superior low light performance.
Paper Details
Date Published: 7 March 2013
PDF: 10 pages
Proc. SPIE 8667, Multimedia Content and Mobile Devices, 86671C (7 March 2013); doi: 10.1117/12.2020064
Published in SPIE Proceedings Vol. 8667:
Multimedia Content and Mobile Devices
Reiner Creutzburg; Todor G. Georgiev; Dietmar Wüller; Cees G. M. Snoek; Kevin J. Matherson; David Akopian; Andrew Lumsdaine; Lyndon S. Kennedy, Editor(s)
PDF: 10 pages
Proc. SPIE 8667, Multimedia Content and Mobile Devices, 86671C (7 March 2013); doi: 10.1117/12.2020064
Show Author Affiliations
Eero Salmelin, Nokia Corp. (Finland)
Ari Partinen, Nokia Corp. (Finland)
Ari Partinen, Nokia Corp. (Finland)
Published in SPIE Proceedings Vol. 8667:
Multimedia Content and Mobile Devices
Reiner Creutzburg; Todor G. Georgiev; Dietmar Wüller; Cees G. M. Snoek; Kevin J. Matherson; David Akopian; Andrew Lumsdaine; Lyndon S. Kennedy, Editor(s)
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