
Proceedings Paper
Relation between signal-noise-ratio of UV image intensifier and voltage of MCPFormat | Member Price | Non-Member Price |
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Paper Abstract
A system of signal-to-noise ration (SNR)tester for LLL image intensifier is reconstructed . To realize SNR tester for UV
image intensifier,the signal processing module and measurement software of the tester are reconstructed.The system of
UV optical path is used. Based on photoemission mechanism of photocathode, noise factor of photocathode is concerned
with quantum yield. In a range,noise factor of micro-channel plate(MCP) is decreased with the increase in gain. For a
fixed size micro channel,the gain of MCP is increased as the voltage of MCP rises. The analyzed results show that when
the voltage of MCP is in the range of -700V~-850V,the noise factor is monotonically decreased,when it exceed -850V,
MCP is saturated. Although gain has continued to increase, noise factor is in the state of saturation. Experiment platform
is builded according to SNR tester principle diagram of UV image intensifier.The results are given and analyzed. The
conclusion is proved that the effect of voltage of MCP on the SNR of UV image intensifier is compatible with the
analysis of theory.
Paper Details
Date Published: 4 March 2013
PDF: 5 pages
Proc. SPIE 8761, PIAGENG 2013: Image Processing and Photonics for Agricultural Engineering, 87610T (4 March 2013); doi: 10.1117/12.2019665
Published in SPIE Proceedings Vol. 8761:
PIAGENG 2013: Image Processing and Photonics for Agricultural Engineering
Honghua Tan, Editor(s)
PDF: 5 pages
Proc. SPIE 8761, PIAGENG 2013: Image Processing and Photonics for Agricultural Engineering, 87610T (4 March 2013); doi: 10.1117/12.2019665
Show Author Affiliations
Jin Zhou, Nanjing Univ. of Science and Technology (China)
Yafeng Qiu, Nanjing Univ. of Science and Technology (China)
Yafeng Qiu, Nanjing Univ. of Science and Technology (China)
Xinglin Wu, Nanjing Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 8761:
PIAGENG 2013: Image Processing and Photonics for Agricultural Engineering
Honghua Tan, Editor(s)
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