
Proceedings Paper
Compact wavelength monitor for remote sensing applications suitable to precisely measure the wavelength of individual laser pulsesFormat | Member Price | Non-Member Price |
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Paper Abstract
A compact and fast-response wavelength monitor is described that can determine the wavelength of individual laser pulses with a resolution of a few pm. It combines a position-sensitive photo detector with an optical coating that converts the wavelength information of the incident light into a spatial intensity distribution on the photo detector. Differential read-out of the photo detector is used to determine the centroid of this distribution. Wavelength change between individual laser pulses is detected as a shift of the centroid of the spatial light distribution on the detector. The wavelength monitor is demonstrated with results from a wavelength-tunable fiber laser that can produce randomly accessible sequences of laser pulses.
Paper Details
Date Published: 31 May 2013
PDF: 4 pages
Proc. SPIE 8720, Photonic Applications for Aerospace, Commercial, and Harsh Environments IV, 87200P (31 May 2013); doi: 10.1117/12.2017959
Published in SPIE Proceedings Vol. 8720:
Photonic Applications for Aerospace, Commercial, and Harsh Environments IV
Alex A. Kazemi; Bernard C. Kress; Simon Thibault, Editor(s)
PDF: 4 pages
Proc. SPIE 8720, Photonic Applications for Aerospace, Commercial, and Harsh Environments IV, 87200P (31 May 2013); doi: 10.1117/12.2017959
Show Author Affiliations
Tobias Staudt, PARC, a Xerox Co. (United States)
Peter Kiesel, PARC, a Xerox Co. (United States)
Joerg Martini, PARC, a Xerox Co. (United States)
Peter Kiesel, PARC, a Xerox Co. (United States)
Joerg Martini, PARC, a Xerox Co. (United States)
Noble M. Johnson, PARC, a Xerox Co. (United States)
Chris Urbina, Akamai Physics Inc. (United States)
Edward Burlbaw, Akamai Physics Inc. (United States)
Chris Urbina, Akamai Physics Inc. (United States)
Edward Burlbaw, Akamai Physics Inc. (United States)
Published in SPIE Proceedings Vol. 8720:
Photonic Applications for Aerospace, Commercial, and Harsh Environments IV
Alex A. Kazemi; Bernard C. Kress; Simon Thibault, Editor(s)
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