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Proceedings Paper

Analysis of Fano-line shapes from agile resonant waveguide grating sensors using correlation techniques
Author(s): K. Bougot-Robin; W. J. Wen; H. Benisty
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Paper Abstract

The asymmetric Fano resonance lineshape, resulting from interference between background and a resonant scattering, is archetypal in resonant waveguide grating (RWG) reflectivity. Resonant profile shift resulting from a change of refractive index (from fluid medium or biomolecules at the chip surface) is classically used to perform label-free sensing. Lineshapes are sometimes sampled at discretized “detuning” values to relax instrumental demands, the highest reflectivity element giving a coarse resonance estimate. A finer extraction, needed to increase sensor sensitivity, can be obtained using a correlation approach, correlating the sensed signal to a zero-shifted reference signal. Correlation approach is robust to asymmetry of Fano lineshapes and allows more accurate determination than usual fitting options such as Gaussian or Lorentz shape fitting. Our findings are illustrated with resonance profiles from silicon nitride “chirped” RWGs operated at visible wavelengths. The scheme circumvents the classical but demanding spectral or angular scans: instead of varying angle or wavelength through fragile moving parts or special optics, a RWG structure parameter is varied. Then, the spatial reflectivity profiles of tracks composed of RWGs units with slowly varying filling factor (thus slowly varying resonance condition) are measured under monochromatic conditions. Extracting the resonance location using plain images of these “pixelated” Fano profiles allows multiplex refractive index based sensing with a sensitivity down to 2×10-5 RIU as demonstrated experimentally. This scheme based on a “Peak-tracking chip” demonstrates a new technique for bioarray imaging using a simpler set-up that maintains high performance with cheap lenses.

Paper Details

Date Published: 3 May 2013
PDF: 7 pages
Proc. SPIE 8774, Optical Sensors 2013, 87741B (3 May 2013); doi: 10.1117/12.2017563
Show Author Affiliations
K. Bougot-Robin, The Hong Kong Univ. of Science and Technology (Hong Kong, China)
W. J. Wen, The Hong Kong Univ. of Science and Technology (Hong Kong, China)
H. Benisty, Lab. Charles Fabry, CNRS, Institut d'Optique Graduate School (France)

Published in SPIE Proceedings Vol. 8774:
Optical Sensors 2013
Francesco Baldini; Jiri Homola; Robert A. Lieberman, Editor(s)

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