
Proceedings Paper
Preparation and characterization of silver nanowires films for infrared radiation shieldingFormat | Member Price | Non-Member Price |
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Paper Abstract
We studied the infrared properties randomly oriented silver nanowires films deposited onto different substrates. The investigated nanowires have cross-sectional diameters included between few to hundreds nanometers, while their lengths span from some microns to some tenths microns. Several films of silver nanowires were realized and the infrared emission of the obtained films was characterized in the long infrared range, i.e. 8-12 microns, by observing their temperature evolution under heating regime (maximum applied temperature ~90°) with a focal plane array (FPA) infrared camera. Under heating conditions, the apparent temperature of the silver nanowires films qualitatively follows the trend of the corresponding heating source temperature, while the absolute value keeps always somewhat lower. The experimental results show that the choice of metal filling factor may affect the resulting infrared emission and suggest that these coatings are suitable for infrared signature reduction applications.
Paper Details
Date Published: 6 May 2013
PDF: 6 pages
Proc. SPIE 8771, Metamaterials VIII, 877107 (6 May 2013); doi: 10.1117/12.2017516
Published in SPIE Proceedings Vol. 8771:
Metamaterials VIII
Vladimir Kuzmiak; Peter Markos; Tomasz Szoplik, Editor(s)
PDF: 6 pages
Proc. SPIE 8771, Metamaterials VIII, 877107 (6 May 2013); doi: 10.1117/12.2017516
Show Author Affiliations
Maria Cristina Larciprete, Univ. degli Studi di Roma La Sapienza (Italy)
Alessandro Belardini, Univ. degli Studi di Roma La Sapienza (Italy)
Grigore Leahu, Univ. degli Studi di Roma La Sapienza (Italy)
Roberto Li Voti, Univ. degli Studi di Roma La Sapienza (Italy)
Alessandro Belardini, Univ. degli Studi di Roma La Sapienza (Italy)
Grigore Leahu, Univ. degli Studi di Roma La Sapienza (Italy)
Roberto Li Voti, Univ. degli Studi di Roma La Sapienza (Italy)
Francesco Mura, Univ. degli Studi di Roma La Sapienza (Italy)
Alessandro Albertoni, BFi OPTiLAS S.A. (Italy)
Concita Sibilia, Univ. degli Studi di Roma La Sapienza (Italy)
Alessandro Albertoni, BFi OPTiLAS S.A. (Italy)
Concita Sibilia, Univ. degli Studi di Roma La Sapienza (Italy)
Published in SPIE Proceedings Vol. 8771:
Metamaterials VIII
Vladimir Kuzmiak; Peter Markos; Tomasz Szoplik, Editor(s)
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