We will present two kinds of terahertz (THz) 3D imaging performed with a continuous-wave (CW) source and phase-shifting interferometry. The first one is THz computed tomography (CT) by using phase information instead of intensity information. This minimized the effect of change in the signal strength due to diffraction and artifacts especially emerged around the edge of boundary between different materials. The second one is for the depth imaging of the surface of reflecting materials. By using a simple Michelson’s interferometer, we achieved the depth resolution of 1.1 μm, corresponding to 1/440 of the used wavelength (480 μm).

Date Published: 31 May 2013
PDF: 6 pages
Proc. SPIE 8716, Terahertz Physics, Devices, and Systems VII: Advanced Applications in Industry and Defense, 87160V (31 May 2013); doi: 10.1117/12.2017007

Published in SPIE Proceedings Vol. 8716:
Terahertz Physics, Devices, and Systems VII: Advanced Applications in Industry and Defense
Mehdi F. Anwar; Thomas W. Crowe; Tariq Manzur, Editor(s)