
Proceedings Paper
Multi-point laser coherent detection system and its applications in experimental mechanicsFormat | Member Price | Non-Member Price |
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Paper Abstract
Laser Doppler vibrometry(LDV) is a precise and non-contact optical interferometry used to measure vibrations of
structures and machine components. LDV can only provide a point-wise measurement, or a scanning measurement via
moving the laser beam rapidly onto the vibrating object which is assumed to be invariant in the scanning course.
Consequently, LDV is usually impractical to do measurement on transient events. In this paper, a new self-synchronized
multipoint LDV is proposed. The multiple laser beams are separated from one laser source, and different frequency shifts
are introduced into these beams by a combination of acousto-optic modulators. The laser beams are projected on
different points, and the reflected beams interfere with a common reference beam. The interference light intensity signal
is recorded by a single photodetector. This multipoint LDV has the flexibility to measure the vibration of different points
on various surfaces. In this study, two applications in experimental mechanics area are presented. Firstly, the proposed
system is used to measure the resonant frequencies of structure in a shock test. Secondly, The proposed multi-point LDV
is also used to measure the mode shape of a beam with an artificial crack. Compared with the original vibration mode
shape, the crack location can be identified easily.
Paper Details
Date Published: 22 June 2013
PDF: 6 pages
Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87690W (22 June 2013); doi: 10.1117/12.2016664
Published in SPIE Proceedings Vol. 8769:
International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
Chenggen Quan; Kemao Qian; Anand Asundi, Editor(s)
PDF: 6 pages
Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87690W (22 June 2013); doi: 10.1117/12.2016664
Show Author Affiliations
C. Yang, Nanyang Technological Univ. (Singapore)
Univ. of Science and Technology of China (China)
Y. J. Xu, Nanyang Technological Univ. (Singapore)
Southeast Univ. (China)
M. Guo, Nanyang Technological Univ. (Singapore)
H. Liu, Nanyang Technological Univ. (Singapore)
Univ. of Science and Technology of China (China)
Y. J. Xu, Nanyang Technological Univ. (Singapore)
Southeast Univ. (China)
M. Guo, Nanyang Technological Univ. (Singapore)
H. Liu, Nanyang Technological Univ. (Singapore)
K. Yan, Nanyang Technological Univ. (Singapore)
J. Yuan, Nanyang Technological Univ. (Singapore)
Y. Fu, Nanyang Technological Univ. (Singapore)
J. Yuan, Nanyang Technological Univ. (Singapore)
Y. Fu, Nanyang Technological Univ. (Singapore)
Published in SPIE Proceedings Vol. 8769:
International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
Chenggen Quan; Kemao Qian; Anand Asundi, Editor(s)
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