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Proceedings Paper

Some discussion on high-speed-imaging-based optical coherent measurement
Author(s): Y. Fu; J. Yuan; Y. J. Xu; M. Guo; H. Liu; K. Yan; C. Yang; H. Miao
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Paper Abstract

Optical coherent detection is a precise and non-contact method for measurement of tiny deformation or movement of an object. In the last century, it can only be used on the static or quasi-static measurement of deformation between two statuses. Recently it has been applied on dynamic measurement with the help of high-speed camera. The advantage of this technique is that it can offer a full-field measurement. However, due to the limited capturing rate of high-speed camera, its capability in temporal domain cannot meet the requirements of many applications. In this study, several issues in high-speed-camera-based optical interferometry are discussed. For example, introduction of carrier in temporal and spatial domain, signal processing in temporal-frequency domain, and the introduction of dual-wavelength interferometry in dynamic measurement. The discussion leads to a clue to select suitable technique to fulfill whole-field dynamic measurement at different ranges.

Paper Details

Date Published: 22 June 2013
PDF: 6 pages
Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 876917 (22 June 2013); doi: 10.1117/12.2016663
Show Author Affiliations
Y. Fu, Nanyang Technological Univ. (Singapore)
J. Yuan, Nanyang Technological Univ. (Singapore)
Y. J. Xu, Nanyang Technological Univ. (Singapore)
Southeast Univ. (China)
M. Guo, Nanyang Technological Univ. (Singapore)
H. Liu, Nanyang Technological Univ. (Singapore)
K. Yan, Nanyang Technological Univ. (Singapore)
C. Yang, Nanyang Technological Univ. (Singapore)
Univ. of Science and Technology of China (China)
H. Miao, Univ. of Science and Technology of China (China)

Published in SPIE Proceedings Vol. 8769:
International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
Chenggen Quan; Kemao Qian; Anand Asundi, Editor(s)

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