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Proceedings Paper

Measure of decoherence in quantum error correction for solid-state quantum computing
Author(s): Alexey A. Melnikov; Leonid E. Fedichkin
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Paper Abstract

We considered the interaction of semiconductor quantum register with noisy environment leading to various types of qubit errors. We analysed both phase and amplitude decays during the process of electron-phonon interaction. The performance of quantum error correction codes (QECC) which will be inevitably used in full scale quantum information processors was studied in realistic conditions in semiconductor nanostructures. As a hardware basis for quantum bit we chose the quantum spatial states of single electron in semiconductor coupled double quantum dot system. The modified 5- and 9-qubit quantum error correction (QEC) algorithms by Shor and DiVincenzo without error syndrome extraction were applied to quantum register. 5-qubit error correction procedures were implemented for Si charge double dot qubits in the presence of acoustic phonon environment. ¬-matrix, Choi{Jamio lkowski state and measure of decoherence techniques were used to quantify qubit faulttolerance. Our results showed that the introduction of above quantum error correction techniques at small phonon noise levels provided quadratic improvement of output error rates. The effciency of 5-qubits quantum error correction algorithm in semiconductor quantum information processors was demonstrated.

Paper Details

Date Published: 3 January 2013
PDF: 11 pages
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87001H (3 January 2013); doi: 10.1117/12.2016639
Show Author Affiliations
Alexey A. Melnikov, Institute of Physics and Technology (Russian Federation)
Moscow Institute of Physics and Technology (Russian Federation)
Leonid E. Fedichkin, Institute of Physics and Technology (Russian Federation)
Moscow Institute of Physics and Technology (Russian Federation)
NIX (Russian Federation)

Published in SPIE Proceedings Vol. 8700:
International Conference Micro- and Nano-Electronics 2012
Alexander A. Orlikovsky, Editor(s)

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