Proceedings Paper
Effects of radiation-induced defects on the charge collection efficiency of a silicon carbide particle detector| Format | Member Price | Non-Member Price |
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Paper Abstract
Radiation hardness of 6H silicon carbide (SiC) p+n diode particle detectors has been studied. The charge collection efficiency (CCE) of the detectors decreases with the increased fluence of electrons with energies of 0.2 MeV and higher. Defect X2 with an activation energy of 0.5 eV was found in all detectors which showed the decreased CCE. The decreased CCE was restored to the initial value by thermal annealing of defect X2. It is concluded that defect X2 is responsible for the decreased CCE of 6H-SiC p+n diode particle detectors.
Paper Details
Date Published: 29 May 2013
PDF: 8 pages
Proc. SPIE 8725, Micro- and Nanotechnology Sensors, Systems, and Applications V, 87252G (29 May 2013); doi: 10.1117/12.2016464
Published in SPIE Proceedings Vol. 8725:
Micro- and Nanotechnology Sensors, Systems, and Applications V
Thomas George; M. Saif Islam; Achyut K. Dutta, Editor(s)
PDF: 8 pages
Proc. SPIE 8725, Micro- and Nanotechnology Sensors, Systems, and Applications V, 87252G (29 May 2013); doi: 10.1117/12.2016464
Show Author Affiliations
Naoya Iwamoto, Japan Atomic Energy Agency (Japan)
Shinobu Onoda, Japan Atomic Energy Agency (Japan)
Takahiro Makino, Japan Atomic Energy Agency (Japan)
Shinobu Onoda, Japan Atomic Energy Agency (Japan)
Takahiro Makino, Japan Atomic Energy Agency (Japan)
Takeshi Ohshima, Japan Atomic Energy Agency (Japan)
Kazutoshi Kojima, National Institute of Advanced Industrial Science and Technology (Japan)
Shinji Nozaki, The Univ. of Electro-Communications (Japan)
Kazutoshi Kojima, National Institute of Advanced Industrial Science and Technology (Japan)
Shinji Nozaki, The Univ. of Electro-Communications (Japan)
Published in SPIE Proceedings Vol. 8725:
Micro- and Nanotechnology Sensors, Systems, and Applications V
Thomas George; M. Saif Islam; Achyut K. Dutta, Editor(s)
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