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Proceedings Paper

Joint Transform Correlation for face tracking: elderly fall detection application
Author(s): Philippe Katz; Michael Aron; Ayman Alfalou
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Paper Abstract

In this paper, an iterative tracking algorithm based on a non-linear JTC (Joint Transform Correlator) architecture and enhanced by a digital image processing method is proposed and validated. This algorithm is based on the computation of a correlation plane where the reference image is updated at each frame. For that purpose, we use the JTC technique in real time to track a patient (target image) in a room fitted with a video camera. The correlation plane is used to localize the target image in the current video frame (frame i). Then, the reference image to be exploited in the next frame (frame i+1) is updated according to the previous one (frame i). In an effort to validate our algorithm, our work is divided into two parts: (i) a large study based on different sequences with several situations and different JTC parameters is achieved in order to quantify their effects on the tracking performances (decimation, non-linearity coefficient, size of the correlation plane, size of the region of interest...). (ii) the tracking algorithm is integrated into an application of elderly fall detection. The first reference image is a face detected by means of Haar descriptors, and then localized into the new video image thanks to our tracking method. In order to avoid a bad update of the reference frame, a method based on a comparison of image intensity histograms is proposed and integrated in our algorithm. This step ensures a robust tracking of the reference frame. This article focuses on face tracking step optimisation and evalutation. A supplementary step of fall detection, based on vertical acceleration and position, will be added and studied in further work.

Paper Details

Date Published: 29 April 2013
PDF: 14 pages
Proc. SPIE 8748, Optical Pattern Recognition XXIV, 87480I (29 April 2013); doi: 10.1117/12.2016413
Show Author Affiliations
Philippe Katz, Institut Supérieur de l’Electronique et du Numérique (France)
Michael Aron, Institut Supérieur de l’Electronique et du Numérique (France)
Ayman Alfalou, Institut Supérieur de l’Electronique et du Numérique (France)

Published in SPIE Proceedings Vol. 8748:
Optical Pattern Recognition XXIV
David Casasent; Tien-Hsin Chao, Editor(s)

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