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Proceedings Paper

Concept of operations for knowledge discovery from Big Data across enterprise data warehouses
Author(s): Sreenivas R. Sukumar; Mohammed M. Olama; Allen W. McNair; James J. Nutaro
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Paper Abstract

The success of data-driven business in government, science, and private industry is driving the need for seamless integration of intra and inter-enterprise data sources to extract knowledge nuggets in the form of correlations, trends, patterns and behaviors previously not discovered due to physical and logical separation of datasets. Today, as volume, velocity, variety and complexity of enterprise data keeps increasing, the next generation analysts are facing several challenges in the knowledge extraction process. Towards addressing these challenges, data-driven organizations that rely on the success of their analysts have to make investment decisions for sustainable data/information systems and knowledge discovery. Options that organizations are considering are newer storage/analysis architectures, better analysis machines, redesigned analysis algorithms, collaborative knowledge management tools, and query builders amongst many others. In this paper, we present a concept of operations for enabling knowledge discovery that data-driven organizations can leverage towards making their investment decisions. We base our recommendations on the experience gained from integrating multi-agency enterprise data warehouses at the Oak Ridge National Laboratory to design the foundation of future knowledge nurturing data-system architectures.

Paper Details

Date Published: 28 May 2013
PDF: 9 pages
Proc. SPIE 8758, Next-Generation Analyst, 875805 (28 May 2013); doi: 10.1117/12.2016321
Show Author Affiliations
Sreenivas R. Sukumar, Oak Ridge National Lab. (United States)
Mohammed M. Olama, Oak Ridge National Lab. (United States)
Allen W. McNair, Oak Ridge National Lab. (United States)
James J. Nutaro, Oak Ridge National Lab. (United States)

Published in SPIE Proceedings Vol. 8758:
Next-Generation Analyst
Barbara D. Broome; David L. Hall; James Llinas, Editor(s)

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