Proceedings Paper
Surface optical properties for copper based on surface Kramers-Kroning analysis| Format | Member Price | Non-Member Price |
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Paper Abstract
Differential surface excitation probability for medium energy electrons traveling in Cu is extracted from reflection electron energy loss spectra using various theoretical models and the Werner’s elimination-retrieved algorithm. While the reflection electron energy loss spectra of Cu thin film were measured by the hemispherical analyzer, the bulk spectra of Cu were recorded by a cylindrical mirror analyzer. Surface Kramers-Kronig dispersion relationship is employed to analyze the surface energy loss function and to derive the complex dielectric constant. We found that the obtained surface optical data approximate reasonably well the optical properties of surface layer.
Paper Details
Date Published: 29 May 2013
PDF: 6 pages
Proc. SPIE 8729, Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 87290I (29 May 2013); doi: 10.1117/12.2016266
Published in SPIE Proceedings Vol. 8729:
Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Michael T. Postek; Dale E. Newbury; S. Frank Platek; Tim K. Maugel, Editor(s)
PDF: 6 pages
Proc. SPIE 8729, Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 87290I (29 May 2013); doi: 10.1117/12.2016266
Show Author Affiliations
T. Tang, Univ. of Science and Technology of China (China)
Z. M. Zhang, Univ. of Science and Technology of China (China)
K. Tőkési, Institute of Nuclear Research (Hungary)
Z. M. Zhang, Univ. of Science and Technology of China (China)
K. Tőkési, Institute of Nuclear Research (Hungary)
K. Goto, Nagoya Institute of Technology (Japan)
Z. J. Ding, Univ. of Science and Technology of China (China)
Z. J. Ding, Univ. of Science and Technology of China (China)
Published in SPIE Proceedings Vol. 8729:
Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Michael T. Postek; Dale E. Newbury; S. Frank Platek; Tim K. Maugel, Editor(s)
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