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Proceedings Paper

Single nanocrystal spectroscopy approaches for investigation of emission efficiency and recombination dynamics of multi-excitons
Author(s): Benjamin D. Mangum; Young-Shin Park; Yagnaseni Ghosh; Jennifer A. Hollingsworth; Han Htoon
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Paper Abstract

Understanding and controlling the emission efficiency and recombination dynamics of bi-excitonic states (i.e. QBX and τBX) in semiconductor nanocrystal quantum dots (NQDs) holds the key to many novel technological applications including optical amplification, entangled photon-pair generation and carrier multiplication. Here we present novel single particle spectroscopy approaches capable of measuring these parameter directly. Our approaches are based on second order photon correlation spectroscopy (g(2) (τ)) and can also be applied to small clusters of NQDs to determine the number of NQDs in a cluster together with average value of QBX and τBX. Specifically, first we demonstrate that the ratio of the areas of center and side peaks of the g(2) (τ) function of the spectrally integrated PL of a single NQD provide a precise measure of the ratio of the quantum yield of single and bi-exciton states. Next, we present a time gated photon correlation spectroscopy approach that allows separation of the effects of multi-exciton emission and NQD clustering in g(2) measurements. Finally, we present how the emission of bi-excitons can be separated in g(2) (τ) measurements and extract decay dynamics of bi-excitons without any ambiguity.

Paper Details

Date Published: 3 June 2013
PDF: 14 pages
Proc. SPIE 8727, Advanced Photon Counting Techniques VII, 87270S (3 June 2013); doi: 10.1117/12.2016074
Show Author Affiliations
Benjamin D. Mangum, Los Alamos National Lab. (United States)
Young-Shin Park, Los Alamos National Lab. (United States)
Yagnaseni Ghosh, Los Alamos National Lab. (United States)
Jennifer A. Hollingsworth, Los Alamos National Lab. (United States)
Han Htoon, Los Alamos National Lab. (United States)


Published in SPIE Proceedings Vol. 8727:
Advanced Photon Counting Techniques VII
Mark A. Itzler; Joe C. Campbell, Editor(s)

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