
Proceedings Paper
A new morphology algorithm for shoreline extraction from DEM dataFormat | Member Price | Non-Member Price |
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Paper Abstract
Digital elevation models (DEMs) are a digital representation of elevations at regularly spaced points. They
provide an accurate tool to extract the shoreline profiles. One of the emerging sources of creating them is light
detection and ranging (LiDAR) that can capture a highly dense cloud points with high resolution that can
reach 15 cm and 100 cm in the vertical and horizontal directions respectively in short periods of time. In this
paper we present a multi-step morphological algorithm to extract shorelines locations from the DEM data and
a predefined tidal datum. Unlike similar approaches, it utilizes Lowess nonparametric regression to estimate
the missing values within the DEM file. Also, it will detect and eliminate the outliers and errors that result
from waves, ships, etc by means of anomality test with neighborhood constrains. Because, there might be some
significant broken regions such as branches and islands, it utilizes a constrained morphological open and close
to reduce these artifacts that can affect the extracted shorelines. In addition, it eliminates docks, bridges and
fishing piers along the extracted shorelines by means of Hough transform. Based on a specific tidal datum, the
algorithm will segment the DEM data into water and land objects. Without sacrificing the accuracy and the
spatial details of the extracted boundaries, the algorithm should smooth and extract the shoreline profiles by
tracing the boundary pixels between the land and the water segments. For given tidal values, we qualitatively
assess the visual quality of the extracted shorelines by superimposing them on the available aerial photographs.
Paper Details
Date Published: 29 April 2013
PDF: 10 pages
Proc. SPIE 8748, Optical Pattern Recognition XXIV, 87480D (29 April 2013); doi: 10.1117/12.2015801
Published in SPIE Proceedings Vol. 8748:
Optical Pattern Recognition XXIV
David Casasent; Tien-Hsin Chao, Editor(s)
PDF: 10 pages
Proc. SPIE 8748, Optical Pattern Recognition XXIV, 87480D (29 April 2013); doi: 10.1117/12.2015801
Show Author Affiliations
Amr Hussein Yousef, Old Dominion Univ. (United States)
Khan Iftekharuddin, Old Dominion Univ. (United States)
Khan Iftekharuddin, Old Dominion Univ. (United States)
Mohammad Karim, Old Dominion Univ. (United States)
Published in SPIE Proceedings Vol. 8748:
Optical Pattern Recognition XXIV
David Casasent; Tien-Hsin Chao, Editor(s)
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