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Proceedings Paper

Increasing situational awareness in DVE with advanced synthetic vision
Author(s): T. Schafhitzel; M. Hoyer; P. Völschow
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Paper Abstract

One of the major causes for hazardous situations in aviation is the lack of a pilot’s situational awareness. Common causes for degraded situational awareness are Brownout and Whiteout situations, low level flights, and flights in DVE. In this paper, we propose Advanced Synthetic Vision (ASV), a modern situational awareness solution. ASV combines both Synthetic Vision and Enhanced Vision in order to provide the pilot most timeliness information without being restricted in the spatial coverage of the synthetic representation. The advantages to a common Enhanced Synthetic Vision System are the following: (1) ASV uses 3D ladar data instead of a 2D sensor. The 3D point cloud is classified in real-time to distinguish between ground, wires, poles and buildings; (2) the classified sensor data is fused with onboard data base contents like elevation or obstacles. The entire data fusion is performed in 3D, i.e. output is a merged 3D scenario instead of a blended 2D image. Once the sensor stopped recording due to occlusion, ASV switches to pure data base mode; (3) the merged data is passed to a 3D visualization module, which is fully configurable in order to support synthetic views on head down displays as well as more abstract augmented representations on helmet mounted displays; (4) the extendable design of ASV supports the graphical linking of functions like 3D landing aid, TAWS, or navigation aids.

Paper Details

Date Published: 16 May 2013
PDF: 15 pages
Proc. SPIE 8737, Degraded Visual Environments: Enhanced, Synthetic, and External Vision Solutions 2013, 87370C (16 May 2013); doi: 10.1117/12.2015800
Show Author Affiliations
T. Schafhitzel, Cassidian (Germany)
M. Hoyer, Cassidian (Germany)
P. Völschow, Cassidian (Germany)

Published in SPIE Proceedings Vol. 8737:
Degraded Visual Environments: Enhanced, Synthetic, and External Vision Solutions 2013
Kenneth L. Bernier; Jeff J. Güell, Editor(s)

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