
Proceedings Paper
Radiation-tolerant microprocessors in Japanese scientific space vehicles: how to maximize the benefits of commercial SOI technologiesFormat | Member Price | Non-Member Price |
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Paper Abstract
Development of semiconductor devices not only for harsh radiation environments such as space but also for ground-based applications now faces a major hurdle of radiation problems. Necessary is protecting chips from malfunctions due to sub-nanosecond transient noises induced by radiation. As a protection technique using the silicon-on-insulator structure is often suggested, but the use in fact requires devices and circuits carefully optimized for maximizing its benefits. Mainly describing theoretical and experimental characterization of the transient effects, this paper presents a comprehensive study on radiation responses of commercial silicon-on- insulator technologies, which study results in a space-use low-power system-on-chip with a 100-MIPS RISC-based core.
Paper Details
Date Published: 29 May 2013
PDF: 11 pages
Proc. SPIE 8725, Micro- and Nanotechnology Sensors, Systems, and Applications V, 872517 (29 May 2013); doi: 10.1117/12.2015658
Published in SPIE Proceedings Vol. 8725:
Micro- and Nanotechnology Sensors, Systems, and Applications V
Thomas George; M. Saif Islam; Achyut K. Dutta, Editor(s)
PDF: 11 pages
Proc. SPIE 8725, Micro- and Nanotechnology Sensors, Systems, and Applications V, 872517 (29 May 2013); doi: 10.1117/12.2015658
Show Author Affiliations
Daisuke Kobayashi, Institute of Space and Astronautical Science (Japan)
The Univ. of Tokyo (Japan)
Kazuyuki Hirose, Institute of Space and Astronautical Science (Japan)
The Univ. of Tokyo (Japan)
The Univ. of Tokyo (Japan)
Kazuyuki Hirose, Institute of Space and Astronautical Science (Japan)
The Univ. of Tokyo (Japan)
Hirobumi Saito, Institute of Space and Astronautical Science (Japan)
The Univ. of Tokyo (Japan)
The Univ. of Tokyo (Japan)
Published in SPIE Proceedings Vol. 8725:
Micro- and Nanotechnology Sensors, Systems, and Applications V
Thomas George; M. Saif Islam; Achyut K. Dutta, Editor(s)
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