Development of semiconductor devices not only for harsh radiation environments such as space but also for ground-based applications now faces a major hurdle of radiation problems. Necessary is protecting chips from malfunctions due to sub-nanosecond transient noises induced by radiation. As a protection technique using the silicon-on-insulator structure is often suggested, but the use in fact requires devices and circuits carefully optimized for maximizing its benefits. Mainly describing theoretical and experimental characterization of the transient effects, this paper presents a comprehensive study on radiation responses of commercial silicon-on- insulator technologies, which study results in a space-use low-power system-on-chip with a 100-MIPS RISC-based core.

Date Published: 29 May 2013
PDF: 11 pages
Proc. SPIE 8725, Micro- and Nanotechnology Sensors, Systems, and Applications V, 872517 (29 May 2013); doi: 10.1117/12.2015658

Published in SPIE Proceedings Vol. 8725:
Micro- and Nanotechnology Sensors, Systems, and Applications V
Thomas George; M. Saif Islam; Achyut K. Dutta, Editor(s)