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Proceedings Paper

High-performance and long-range cooled IR technologies in France
Author(s): Yann Reibel; Thibault Augey; Sebastien Verdet; Patrick Maillart; Laurent Rubaldo; David Billon-Lanfrey; Laurent Mollard; François Marion; Nicolas Baier; Gérard Destefanis
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Paper Abstract

Cooled IR technologies that offer high performances are at the top of DEFIR’s priority list. We have been pursuing further infrared developments on future MWIR detectors, such as the VGA format HOT detector that operates at 150K and the 10μm pitch IR detector which gives us a leading position in innovation In the same time Scorpio LW expands Sofradir's line of small pixel pitch TV format IR detectors from the mid-wavelength to the long-wavelength, broadening the performance attributes of its long wave IR product line. Finally, our dual band MW-LW QWIP detectors (25μm, 384×288 pixels) benefit to tactical platforms giving an all-weather performance and increasing flexibility in the presence of battlefield obscurants. These detectors are designed for long-range surveillance equipment, commander or gunner sights, ground-toground missile launchers and other applications that require higher resolution and sensitivity to improve reconnaissance and target identification. This paper discusses the system level performance in each detector type.

Paper Details

Date Published: 11 June 2013
PDF: 14 pages
Proc. SPIE 8704, Infrared Technology and Applications XXXIX, 87040B (11 June 2013); doi: 10.1117/12.2015601
Show Author Affiliations
Yann Reibel, SOFRADIR (France)
Thibault Augey, SOFRADIR (France)
Sebastien Verdet, SOFRADIR (France)
Patrick Maillart, SOFRADIR (France)
Laurent Rubaldo, SOFRADIR (France)
David Billon-Lanfrey, SOFRADIR (France)
Laurent Mollard, CEA-LETI-Minatec (France)
François Marion, CEA-LETI-Minatec (France)
Nicolas Baier, CEA-LETI-Minatec (France)
Gérard Destefanis, CEA-LETI-Minatec (France)

Published in SPIE Proceedings Vol. 8704:
Infrared Technology and Applications XXXIX
Bjørn F. Andresen; Gabor F. Fulop; Charles M. Hanson; Paul R. Norton; Patrick Robert, Editor(s)

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