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Proceedings Paper

Microscopic fringe projection system and measuring method
Author(s): Jinping Chen; Tong Guo; Longlong Wang; Zhichao Wu; Xing Fu; Xiaotang Hu
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Paper Abstract

Microscopic fringe projection method based on fringe projection and microscopic imaging was proposed to measure the 3D profile of micro-components, which is fast, accurate and non-contact. The measurement system includes two sets of microscope tubes: one for projecting fringe, and the other for imaging. The sinusoidal fringes generated by the software were projected onto the tested object through the DLP projector. The deformed fringes were captured by the CCD camera. The five-step phase shifting method was used for the phase extraction, and the branch cut algorithm was applied for the phase unwrapping process. After system calibration, a coin was measured to show the applicability of the system.

Paper Details

Date Published: 31 January 2013
PDF: 9 pages
Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87594U (31 January 2013); doi: 10.1117/12.2014756
Show Author Affiliations
Jinping Chen, Tianjin Univ. (China)
Tong Guo, Tianjin Univ. (China)
Longlong Wang, Tianjin Univ. (China)
Zhichao Wu, Tianjin Univ. (China)
Xing Fu, Tianjin Univ. (China)
Xiaotang Hu, Tianjin Univ. (China)

Published in SPIE Proceedings Vol. 8759:
Eighth International Symposium on Precision Engineering Measurement and Instrumentation
Jie Lin, Editor(s)

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