
Proceedings Paper
Second-harmonic generation from complex chiral samplesFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Second harmonic generation microscopy has recently become an important tool for studying materials. In this article, we use a recently developed analytical method, for second-harmonic generation microscopy, to determine the point group symmetry of micro crystals of enantiomerically pure 1,1’-bi-2-naphtol.
Paper Details
Date Published: 15 March 2013
PDF: 7 pages
Proc. SPIE 8770, 17th International School on Quantum Electronics: Laser Physics and Applications, 87701F (15 March 2013); doi: 10.1117/12.2014745
Published in SPIE Proceedings Vol. 8770:
17th International School on Quantum Electronics: Laser Physics and Applications
Tanja N. Dreischuh; Albena T. Daskalova, Editor(s)
PDF: 7 pages
Proc. SPIE 8770, 17th International School on Quantum Electronics: Laser Physics and Applications, 87701F (15 March 2013); doi: 10.1117/12.2014745
Show Author Affiliations
M. Vanbel, Univ. of Leuven (Belgium)
S. Vandendriessche, Univ. of Leuven (Belgium)
M. A. van der Veen, Univ. of Leuven (Belgium)
D. Slavov, Institute of Electronics (Bulgaria)
P. Heister, Technische Univ. München (Germany)
S. Vandendriessche, Univ. of Leuven (Belgium)
M. A. van der Veen, Univ. of Leuven (Belgium)
D. Slavov, Institute of Electronics (Bulgaria)
P. Heister, Technische Univ. München (Germany)
R. Paesen, Transnational Univ. Limburg (Belgium)
Univ. Hasselt (Belgium)
V. K. Valev, Katholieke Univ. Leuven (Belgium)
M. Ameloot, Transnational Univ. Limburg (Belgium)
Univ. Hasselt (Belgium)
T. Verbiest, Katholieke Univ. Leuven (Belgium)
Univ. Hasselt (Belgium)
V. K. Valev, Katholieke Univ. Leuven (Belgium)
M. Ameloot, Transnational Univ. Limburg (Belgium)
Univ. Hasselt (Belgium)
T. Verbiest, Katholieke Univ. Leuven (Belgium)
Published in SPIE Proceedings Vol. 8770:
17th International School on Quantum Electronics: Laser Physics and Applications
Tanja N. Dreischuh; Albena T. Daskalova, Editor(s)
© SPIE. Terms of Use
