
Proceedings Paper
Scattering near specular direction for horizontally oriented ice discsFormat | Member Price | Non-Member Price |
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Paper Abstract
Scattering phase function on horizontally oriented ice particles near the specular reflective direction is analytically modeled using a mixed method combining direct reflection and Fraunhofer diffraction components, where particles are simply treated as circular facets and the effect of fluttering is introduced under the assumption of Gauss distribution. The obtained model expression reveals that the essence of far-field scattering around specular direction is the diffraction pattern modulated by fluttered geometric reflection. Four groups of experiments are designed to validate this model at different wavelengths and incidence angles, and the calculated phase functions present good agreement both in distributions and peak values with that of T-matrix method in conjunction with a Monte Carlo stochastic process.
Paper Details
Date Published: 31 January 2013
PDF: 10 pages
Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 875921 (31 January 2013); doi: 10.1117/12.2014419
Published in SPIE Proceedings Vol. 8759:
Eighth International Symposium on Precision Engineering Measurement and Instrumentation
Jie Lin, Editor(s)
PDF: 10 pages
Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 875921 (31 January 2013); doi: 10.1117/12.2014419
Show Author Affiliations
Zhile Wang, Harbin Institute of Technology (China)
Yin Zhang, Harbin Institute of Technology (China)
Yiming Cao, Harbin Institute of Technology (China)
Yin Zhang, Harbin Institute of Technology (China)
Yiming Cao, Harbin Institute of Technology (China)
Mingyu Cong, Harbin Institute of Technology (China)
Wenzhuo Bao, Harbin Institute of Technology (China)
Qingyu Hou, Harbin Institute of Technology (China)
Wenzhuo Bao, Harbin Institute of Technology (China)
Qingyu Hou, Harbin Institute of Technology (China)
Published in SPIE Proceedings Vol. 8759:
Eighth International Symposium on Precision Engineering Measurement and Instrumentation
Jie Lin, Editor(s)
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