
Proceedings Paper
Hyperspectral recognition of processing tomato early blight based on GA and SVMFormat | Member Price | Non-Member Price |
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Paper Abstract
Processing tomato early blight seriously affect the yield and quality of its.Determine the leaves spectrum of different
disease severity level of processing tomato early blight.We take the sensitive bands of processing tomato early blight as
support vector machine input vector.Through the genetic algorithm(GA) to optimize the parameters of SVM, We could
recognize different disease severity level of processing tomato early blight.The result show:the sensitive bands of
different disease severity levels of processing tomato early blight is 628-643nm and 689-692nm.The sensitive bands are
as the GA and SVM input vector.We get the best penalty parameters is 0.129 and kernel function parameters is 3.479.We
make classification training and testing by polynomial nuclear,radial basis function nuclear,Sigmoid nuclear.The best
classification model is the radial basis function nuclear of SVM. Training accuracy is 84.615%,Testing accuracy is
80.681%.It is combined GA and SVM to achieve multi-classification of processing tomato early blight.It is provided the
technical support of prediction processing tomato early blight occurrence, development and diffusion rule in large areas.
Paper Details
Date Published: 13 March 2013
PDF: 5 pages
Proc. SPIE 8783, Fifth International Conference on Machine Vision (ICMV 2012): Computer Vision, Image Analysis and Processing, 87831D (13 March 2013); doi: 10.1117/12.2014142
Published in SPIE Proceedings Vol. 8783:
Fifth International Conference on Machine Vision (ICMV 2012): Computer Vision, Image Analysis and Processing
Yulin Wang; Liansheng Tan; Jianhong Zhou, Editor(s)
PDF: 5 pages
Proc. SPIE 8783, Fifth International Conference on Machine Vision (ICMV 2012): Computer Vision, Image Analysis and Processing, 87831D (13 March 2013); doi: 10.1117/12.2014142
Show Author Affiliations
Xiaojun Yin, Shihezi Univ. (China)
SiFeng Zhao, Shihezi Univ. (China)
Published in SPIE Proceedings Vol. 8783:
Fifth International Conference on Machine Vision (ICMV 2012): Computer Vision, Image Analysis and Processing
Yulin Wang; Liansheng Tan; Jianhong Zhou, Editor(s)
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