
Proceedings Paper
focusing by an arbitrary opening paraboloid mirror and its application in confocal scanning microscopyFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Focusing of the plane wave with radially polarized electric field by an arbitrary opening paraboloid mirror is analyzed
using a rigorous vectorial diffraction theory, i.e., Stratton-Chu integral. In the vicinity of the focus, far-field
approximation conditions are used to simplify the derived integrals with sufficiently high accuracy. It is found that a
noticeable deviation of the approximate integral, as characterized by a phenomenon of focal shift, from the exact integral
can be observed when the maximum focusing semi-angle α below π/9. For α=π/2, the radial spot size reduces to below
0.40λ if cutting off the central segment, larger than π/4, of the paraboloid mirror. The sharp focusing property of the
paraboloid mirror has the potential application in super-resolution confocal scanning microscopy. Specific confocal
scanning arrangements are provided and remarked.
Paper Details
Date Published: 31 January 2013
PDF: 6 pages
Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87591Z (31 January 2013); doi: 10.1117/12.2014045
Published in SPIE Proceedings Vol. 8759:
Eighth International Symposium on Precision Engineering Measurement and Instrumentation
Jie Lin, Editor(s)
PDF: 6 pages
Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87591Z (31 January 2013); doi: 10.1117/12.2014045
Show Author Affiliations
Tao Liu, Harbin Institute of Technology (China)
Jiubin Tan, Harbin Institute of Technology (China)
Yuhang Wang, Harbin Institute of Technology (China)
Jiubin Tan, Harbin Institute of Technology (China)
Yuhang Wang, Harbin Institute of Technology (China)
Published in SPIE Proceedings Vol. 8759:
Eighth International Symposium on Precision Engineering Measurement and Instrumentation
Jie Lin, Editor(s)
© SPIE. Terms of Use
