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Proceedings Paper

Ultrafast phenomena at the nanoscale: novel science opportunities at the SwissFEL X-ray Laser
Author(s): B. D. Patterson; R. Abela; H.-H. Braun; R. Ganter; B. Pedrini; M. Pedrozzi; S. Reiche; M. van Daalen
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Paper Abstract

Next-generation X-ray sources, based on the X-ray Free Electron Laser (XFEL) concept, will provide highly coherent, ultrashort pulses of soft and hard X-rays with peak intensity many orders of magnitude above that of a synchrotron. These pulses will allow studies of femtosecond dynamics at nanometer resolution and with chemical selectivity. They will produce coherent-diffraction images of organic and inorganic nanostructures without the deleterious effects of radiation damage.

Paper Details

Date Published: 11 December 2012
PDF: 9 pages
Proc. SPIE 8678, Short-Wavelength Imaging and Spectroscopy Sources, 867802 (11 December 2012); doi: 10.1117/12.2011126
Show Author Affiliations
B. D. Patterson, Paul Scherrer Institute (Switzerland)
R. Abela, Paul Scherrer Institute (Switzerland)
H.-H. Braun, Paul Scherrer Institute (Switzerland)
R. Ganter, Paul Scherrer Institute (Switzerland)
B. Pedrini, Paul Scherrer Institute (Switzerland)
M. Pedrozzi, Paul Scherrer Institute (Switzerland)
S. Reiche, Paul Scherrer Institute (Switzerland)
M. van Daalen, Paul Scherrer Institute (Switzerland)

Published in SPIE Proceedings Vol. 8678:
Short-Wavelength Imaging and Spectroscopy Sources
Davide Bleiner, Editor(s)

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