Proceedings Paper
A criterion for threshold equivalence between static and scanning irradiation of laser beam| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
Both scanning laser irradiation mode and the static mode can cause damage to the materials with different thresholds. In this paper, a simple criterion is derived theoretically to equate the threshold of static irradiation with the scanning one for flat-top laser so that the two damage threshold at different scanning velocity can be compared. The results of numerical simulations are in good agreement with the criterion, and the preliminary experiments verify the criterion.
Paper Details
Date Published: 16 May 2013
PDF: 8 pages
Proc. SPIE 8796, 2nd International Symposium on Laser Interaction with Matter (LIMIS 2012), 879609 (16 May 2013); doi: 10.1117/12.2010785
Published in SPIE Proceedings Vol. 8796:
2nd International Symposium on Laser Interaction with Matter (LIMIS 2012)
Stefan Kaierle; Jingru Liu; Jianlin Cao, Editor(s)
PDF: 8 pages
Proc. SPIE 8796, 2nd International Symposium on Laser Interaction with Matter (LIMIS 2012), 879609 (16 May 2013); doi: 10.1117/12.2010785
Show Author Affiliations
Yaojun Wu, Tsinghua Univ. (China)
Northwest Institute of Nuclear Technology (China)
Qunshu Wang, Northwest Institute of Nuclear Technology (China)
Xisheng Ye, Northwest Institute of Nuclear Technology (China)
Northwest Institute of Nuclear Technology (China)
Qunshu Wang, Northwest Institute of Nuclear Technology (China)
Xisheng Ye, Northwest Institute of Nuclear Technology (China)
Chuanxiang Tang, Tsinghua Univ. (China)
Xinwei Lin, Northwest Institute of Nuclear Technology (China)
Menglian Zhou, Northwest Institute of Nuclear Technology (China)
Xinwei Lin, Northwest Institute of Nuclear Technology (China)
Menglian Zhou, Northwest Institute of Nuclear Technology (China)
Published in SPIE Proceedings Vol. 8796:
2nd International Symposium on Laser Interaction with Matter (LIMIS 2012)
Stefan Kaierle; Jingru Liu; Jianlin Cao, Editor(s)
© SPIE. Terms of Use
