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Proceedings Paper

Time-frequency methods for structural health monitoring of deepwater risers subjected to vortex induced vibrations
Author(s): Chaojun Huang; Peng Sun; Satish Nagarajaiah; S. Gopalakrishnan
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Paper Abstract

In this paper, an approach based on a new damage index-Distributed Force Change(WDFC), for monitoring the structural health of risers used for production in deep-water floating platforms, is presented. Experiments of a scaled pipe are carried out to validate the vibration based damage identification method. The influences of multiple cracks in the WDFC damage index are studied. Futhermore, this paper demonstrates the effectiveness of wave propagation based structural health monitoring (SHM) strategies within the pipe model. This is realized based on the results of numerical investigation obtained by the use of Finite Element Method(FEM) together with application of Time-of-Flight(FoT) damage identification method in which the damage severity is indicated by Root Mean Square(RMS) of the damage-reflected wave. The influence of crack(s) in the riser/pipe on the wave propagation are studied. The results from the experiments and numerical analysis indicate that both the two damage identification methods can provide information about the estimated crack location(s) and the possible extent of crack. Hence the two methods are suitable for globally and locally monitoring the structural health of deepwater risers respectively.

Paper Details

Date Published: 19 April 2013
PDF: 14 pages
Proc. SPIE 8692, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2013, 86923E (19 April 2013); doi: 10.1117/12.2010592
Show Author Affiliations
Chaojun Huang, Rice Univ. (United States)
Peng Sun, Rice Univ. (United States)
Satish Nagarajaiah, Rice Univ. (United States)
S. Gopalakrishnan, Indian Institute of Science (India)

Published in SPIE Proceedings Vol. 8692:
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2013
Jerome Peter Lynch; Chung-Bang Yun; Kon-Well Wang, Editor(s)

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